求翻译：常常，在同一块基片上解理的样品光致发光强度也存在不同，所以本实验使用RPM2000快速扫描光荧光谱仪，以mapping的方法选取表面发光强度均匀一致的样品用于清洗实验。是什么意思？

Often with a base chip samples cleavage PL intensity differences between this experiment rpm2000 fast scanning optical fluorescence spectrometer, sample mapping method to select the surface uniform luminous intensity for the cleaning experiments.

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Frequently, in the sample photoluminescence intensity which cleaves together with the substrate on also exists differently, therefore this experiment uses the RPM2000 rapid scanning light fluorescence spectrometer, uses in by the mapping method selection surface luminous intensity even consistent sa

正在翻译，请等待...

正在翻译，请等待...