求翻译：4.解剖不良品,发現寄回的不良品的FUSE与短路實驗后的FUSE損傷是一样,都是次級异常造成產品電流過大而導致FUSE被燒死,(见附件一圖3)是什么意思？

4 Anatomy of defective products, return the defective products found in the FUSE and the FUSE injury after experimental short-circuit is the same, are sub-products caused by abnormal excessive current caused by FUSE were burned to death (see annex I, figure 3)

4. According to the autopsy bad products, 发 is sent back to the bad products of FUSE 与 short-circuit experimental 后 FUSE the injury is a 样, are secondary 异 often products current is too high and FUSE lead was burned to death, (见 Annex I figure 3)

4. dissections not good, after discovered mails back not good FUSE and the short circuit experiment FUSE damage is same, all is secondary exceptionally creates the product electric current oversized to cause FUSE to burn dies, (sees an appendix chart 3)

4. anatomical defect found mail quality FUSE FUSE damage and short circuit after the experiment is the same, are all secondary exceptions cause the product to excessive current causes the FUSE to be burned to death (see figure in annex 3)

4.Dissect the bad product, FUSE after FUSE and short circuit 驗 of the bad product sending 現 and returning is the same, it is times of 級 that lead to the fact 產 product 電flow large causing FUSE die 過, (see one 3 attachment) unusually all