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关注：1
2013-05-23 12:21
求翻译：ICT治具上電木C31周圍有缺損（如圖），造成ICT測試時小板DC-3240變形較正常狀況更嚴重是什么意思？ 待解决
 悬赏分：1
- 离问题结束还有
ICT治具上電木C31周圍有缺損（如圖），造成ICT測試時小板DC-3240變形較正常狀況更嚴重
问题补充： |
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2013-05-23 12:21:38
Bakelite C31 on ICT fixture around the defect (Figure), resulting in small ICT test board DC-3240 situation is more serious than the normal deformation
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2013-05-23 12:23:18
The ICT more electric C around 31 a discrepancy as shown in Figure), causing ICT test, small board DC-3240 deformation more normal conditions more serious
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2013-05-23 12:24:58
On the ICT fixture around bakelite C31 has the damage (e.g. chart), creates when the ICT test platelet DC-3240 distorts the normal condition to be more serious
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2013-05-23 12:26:38
ICT fixture bakelite on C31 is surrounded by defect (see picture), creating ICT tests small-plate deformation conditions than normal DC-3240 more
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2013-05-23 12:28:18
ICT fixture on electric C31 around defects (pictured), creating ICT tests small-plate deformation conditions than normal DC-3240 more
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